Tektronix CSA8000B User Manual Page 66
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CSA8000B & TDS8000B User Manual
System Overview Maps
The instrument and its sampling modules comprise a highly capable waveform
acquisition, test, and measurement system. The following model provides
background information on its operation, which, in turn, may provide you insight
on how the instrument can be used.
Functional Model Map
Input modules
Timebase
system
Chan 1--8
CH1..8
Math 1--8
SP&T
systems
Modular Sampling
Specialization
Display, I/O,
&Storage
Digital Signal Acquisition
Pages
3--73,
3--101,
3--141
Page
3--101,
3--53
Trigger
system
Page 3--39
Ref 1--8
User I nterface
& Waveform Display
Signal Processing
& Transformation
Page 3--53
Clock recovery
options only
External trigger
inputs
Acquisition
system
Page 3--21
Page 3--14
Channel
Channel
Channel
Page 3--5
Gated trigger
TTL input
(option GT )
The model comprises five high-level subsystems or processes (embodying a
variety of hardware and software functions):
H Modular Sampling Specialization System. Allows you to choose modules
to begin tailoring your waveform acquisition based on the types of signals
you want to acquire: electrical or optical; with clock recovery or without,
with bandwidth filter or not. Provides cost-effective solution for users
needing very high bandwidth with superb time resolution on repetitive
waveforms. Sampling modules determine the size of the vertical acquisition
window for each channel.
- User Manual 1
- 071-1099-03 1
- WARRANTY 3
- Table of Contents 5
- Operating Basics 6
- Reference 6
- Appendices 9
- List of Figures 10
- List of Tables 12
- General Safety Summary 13
- Symbols and Terms 14
- About This Manual 15
- Conventions 16
- Contacting Tektronix 17
- Product Description 19
- Product Software 21
- Firmware Upgrade 22
- Sampling Modules Supported 22
- Check the Package Contents 25
- Installation 27
- Install the Sampling Modules 28
- Maximum Configuration 29
- Connect the Peripherals 30
- Power On the Instrument 31
- Powering Off the Instrument 33
- Back Up User Files 33
- Software Installation 33
- Incoming Inspection 35
- Perform the Diagnostics 36
- Perform the Compensation 38
- Perform the Functional Tests 39
- Verify Electrical Input 40
- Channels 40
- CSA8000/TDS8000 41
- SMA cable from DC calibration 41
- DC CAL Output Limits 43
- Control bar 45
- Vertical offset 45
- Baseline 45
- Verify the 46
- Time Bases Work 46
- Perform Gated Trigger 50
- QA+Win32 56
- Checking the Cooling Fan 57
- Operation 57
- Checking the Hardware 57
- Accessories and O ptions 59
- Optional 60
- Accessories and Options 62
- Operational Maps 63
- Documentation Map 64
- <NR3><Space> 65
- System Overview Maps 66
- Process Overview Map 68
- and position controls 69
- to a waveform 71
- Display Map -- Multiple Views 72
- Front Panel I/O Map 73
- Rear Panel I/O Map 74
- Overview 75
- Horizontal 78
- To Set Up the Signal Input 82
- knob to adjust the selected 83
- To Autoset the Instrument 85
- To Reset the Instrument 87
- Signal Conditioning 87
- Background 87
- Apparent low-frequency 97
- Sampled points 97
- To Set Acquisition Modes 98
- To Start and 100
- Stop Acquisition 100
- Acquisition Hardware 101
- Sampling Process 101
- Sampling Modes 102
- Waveform Record 102
- Acquisition Cycle 103
- FrameScan Acquisitions 104
- What’s Excluded? 105
- Keys to Using 105
- To Acquire in 107
- FrameScan Mode 107
- Acquiring Waveforms 108
- End of Procedure 109
- ToCatchaBitError 110
- Triggering 113
- To Trigger 122
- To Use Gated Trigger 124
- Displaying Waveforms 127
- Why Use? 129
- What’s Special? 129
- Ch Ref Math 131
- Reference / 100) 133
- To Display Waveforms in 136
- To Display Waveforms 138
- Customizing the Display 140
- To Set Display Styles 142
- To Customize the 143
- Graticule and Waveforms 143
- Measuring Waveforms 147
- Taking Automatic Measurements 148
- Select among methods 151
- To Take Automatic 154
- Measurements 154
- To Localize a 157
- Measurement 157
- Taking Cursor Measurements 159
- What Sources 160
- Can I Measure? 160
- Keys to Using Cursors 160
- To Take a Cursor 163
- To Set the Cursor Sources 164
- Compensation 166
- To Compensate the 166
- Instrument and Modules 166
- To Deskew Channels 170
- To Perform Dark-Level 172
- Compensations 172
- Creating Math Waveforms 175
- To Define a 179
- Math Waveform 179
- Operations on Math Waveforms 181
- of a math wavef orm 183
- settings in the source 183
- Data Input and Output 187
- To Save Your Setup 189
- To Recall Your Setup 192
- To Save Your Waveform 195
- To Recall Your Waveform 198
- To Clear References 201
- To Export Your Waveform 202
- To Export Your Histogram 203
- To Use an Exported 203
- Waveform (or Histogram) 203
- Printing Waveforms 206
- To Print Using 208
- Ink-saver Mode 208
- To Print to a File 210
- Set High Color 211
- Remote Communication 213
- Mask Testing Waveforms 215
- To Mask Test a Waveform 219
- To Edit a Mask 223
- Counting Masks 225
- To Create a New Mask 226
- Taking Histograms 228
- Histograms 229
- To Take a Histogram 230
- Histogram 232
- Statistics 232
- Using Waveform Databases 233
- To Set Up a Waveform 236
- Database 236
- Database Display 238
- Accessing Online Help 241
- How to Use Online Help 242
- Cleaning the Instrument 249
- Flat Panel Display Cleaning 250
- Optical Connector Cleaning 250
- Appendix A: Specifications 251
- Table A- 3: 254
- Table A- 6: Display 257
- Table A- 7: Ports 258
- Table A- 9: Mechanical 260
- Certifications 261
- Pulse Measurements - Timing 270
- Pulse Measurement - Area 276
- All Sources 318
- Pulse Sources 319
- Pulse Crossings and 320
- Mid-reference Level 320
- Mid-reference Level (AOP) 320
- Overshoot Levels 321
- RZ Sources 322
- RZ Crossings 323
- NRZ Sources 324
- NRZ Measurement 325
- Reference Levels 325
- NRZ Crossings 326
- NRZ Eye -Aperture 327
- Parameters 327
- NRZ Overshoot Levels 328
- NRZ Crossings ( OMA) 329
- Tracking Methods 330
- Use a Waveform Database 332
- Glossary 333
- of the selected 337
- Index- 1 343
- Index- 2 344
- Index- 3 345
- Index- 4 346
- Index- 5 347
- Index- 6 348
- Index- 7 349
- Index- 8 350
- Index- 9 351
- Index- 10 352
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